IEC-61189-2-805 › Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 2-805: X/Y CTE test for thin base materials by TMA

IEC-61189-2-805 - EDITION 1.0 - CURRENT


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IEC 61189-2-805:2024 defines the method to be followed for the determination of the X/Y coefficient of thermal expansion of thin electrical insulating materials via the use of a thermomechanical analyser (TMA). This method is applicable to materials that are solid for the entire range of temperature used, and that retain sufficient rigidity over the temperature range so that so that irreversible indentation of the specimen by the sensing probe does not occur.
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31.180 (Printed circuits and boards)

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Document Number

IEC 61189-2-805 Ed. 1.0 b:2024

Revision Level

EDITION 1.0

Status

Current

Publication Date

April 1, 2024

Committee Number

91