IEC-61163-1 Reliability stress screening - Part 1: Repairable assemblies manufactured in lots

IEC-61163-1 - 2ND EDITION - CURRENT
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This part of IEC 61163 describes particular methods to apply and optimize reliability stress screening processes for lots of repairable hardware assemblies, in cases where the assemblies have an unacceptably low reliability in the early failure period, and when other methods, such as reliability growth programmes and quality control techniques, are not applicable.
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Document Number

IEC 61163-1 Ed. 2.0 b:2006

Revision Level

2ND EDITION

Status

Current

Publication Date

June 1, 2006

Committee Number

56