IEC-60749-5 › Historical Revision Information
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
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IEC 60749-5:2017(E) provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
a) correction of an error in an equation;
b) inclusion of notes for guidance;
c) clarification of the applicability of test conditions.
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
IEC 60749-5 Ed. 2.0 en:2017
Revision Level
EDITION 2.0
Status
Superseded
Publication Date
April 1, 2017
Committee Number
47