IEC-60749-5 › Historical Revision Information
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
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Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
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31.080.01 (Semiconductor devices in general)
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Document Number
IEC 60749-5 Ed. 1.0 b:2003
Revision Level
1ST EDITION
Status
Superseded
Publication Date
Jan. 1, 2003
Committee Number
47