IEC-60749-39 › Historical Revision Information
Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
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Detailed the procedures for the measurement of the characteristic properties of moisture diffusivity and water solubility in organic materials used in the packaging of semiconductor components. These two material properties are important parameters for the effective reliability performance of plastic packaged semiconductors after exposure to moisture and being subjected to high-temperature solder reflow.
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31.080.01 (Semiconductor devices in general)
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Document Number
IEC 60749-39 Ed. 1.0 b:2006
Revision Level
EDITION 1.0
Status
Superseded
Publication Date
July 1, 2006
Committee Number
47