IEC-60749-36 › Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state

IEC-60749-36 - 1ST EDITION - CURRENT


Document Center Inc. is an authorized dealer of IEC standards.
The following bibliographic material is provided to assist you with your purchasing decision:


Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.
ORDER

Price:

$13.00        


Want this as a site license?

To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

This document comes with our free Notification Service, good for the life of the document.

This document is available in either Paper or PDF format.

 

Customers who bought this document also bought:

10CFR(1-50)
Energy

ASME-NQA-1
Quality Assurance Requirements for Nuclear Facility Applications

AQAP-6
Nato Calibration System Requirements for Industry

Document Number

IEC 60749-36 Ed. 1.0 b:2003

Revision Level

1ST EDITION

Status

Current

Publication Date

Feb. 1, 2003

Committee Number

47