IEC-60749-30-RL › Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

IEC-60749-30-RL - EDITION 2.0 - CURRENT



Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing


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Document Number

S+ IEC 60749-30 Ed. 2.0 en:2020 (Redline version)

Revision Level

EDITION 2.0

Status

Current

Publication Date

Aug. 1, 2020

Page Count

46 pages