IEC-60749-30-AM1 › Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
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Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
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Document Number
IEC 60749-30 Amd.1 Ed. 1.0 b:2011
Revision Level
1ST EDITION AMENDMENT 1
Status
Superseded
Publication Date
May 1, 2011
Committee Number
47