IEC-60749-27-AM1 › Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

IEC-60749-27-AM1 - ED. 2.0 AMENDMENT 1 - SUPERSEDED
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Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
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Document Number

IEC 60749-27 Amd.1 Ed. 2.0 b:2012

Revision Level

ED. 2.0 AMENDMENT 1

Status

Superseded

Publication Date

Sept. 25, 2012

Committee Number

47