EN-60749-44 › Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

EN-60749-44 - 2016 EDITION - CURRENT -- See the following: BS-EN-60749-44



Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices


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Document Number

EN 60749-44:2016

Revision Level

2016 EDITION

Status

Current

Publication Date

Oct. 21, 2016