EN-60749-42 › Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
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31.080.01 (Semiconductor devices in general)
Document Number
EN 60749-42:2014
Revision Level
2014 EDITION
Status
Current
Publication Date
Oct. 3, 2014