EN-60749-37 › Semiconductor Devices, Mechanical & Climatic Test Methods, Board Level Drop Test Metho

EN-60749-37 - 2008 EDITION - CURRENT -- See the following: BS-EN-60749-37



Semiconductor Devices, Mechanical & Climatic Test Methods, Board Level Drop Test Metho


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Document Number

EN-60749-37

Revision Level

2008 EDITION

Status

Current

Publication Date

Jan. 1, 2008