EN-60749-28 › Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
EN-60749-28
-
2017 EDITION
-
CURRENT
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
Document Number
EN 60749-28:2017
Revision Level
2017 EDITION
Status
Current
Publication Date
June 30, 2017