DESC-DWG-5962-96811 › Microcircuit, Digital, Advanced Bipolar CMOS, 3.3 Volt Scan Test Device with 18-Bit Universal Bus Transceiver, with Bus Hold, Three-State Outputs, TTL Compatible Inputs, Monolithic Silicon
Microcircuit, Digital, Advanced Bipolar CMOS, 3.3 Volt Scan Test Device with 18-Bit Universal Bus Transceiver, with Bus Hold, Three-State Outputs, TTL Compatible Inputs, Monolithic Silicon
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Document Number
5962-96811C
Revision Level
REVISION C
Status
Superseded
Publication Date
Sept. 23, 2015
Page Count
30 pages