DESC-DWG-5962-94698 › Microcircuit, Digital, Advanced Bipolar CMOS, Scan Test Device with 18-Bit Transceiver and Register, Three-State Outputs and TTL Compatible Inputs, Monolithic Silicon
Microcircuit, Digital, Advanced Bipolar CMOS, Scan Test Device with 18-Bit Transceiver and Register, Three-State Outputs and TTL Compatible Inputs, Monolithic Silicon
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Document Number
5962-94698B
Revision Level
REVISION B
Status
Current
Publication Date
June 25, 2015
Page Count
30 pages