DESC-DWG-5962-94601 › Microcircuit, Digital, Advanced Bipolar CMOS, Scan Test Device with 18-Bit Bus Transceiver, Three-State Outputs, TTL Compatible Inputs, Monolithic Silicon

DESC-DWG-5962-94601 - REVISION D - SUPERSEDED
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Microcircuit, Digital, Advanced Bipolar CMOS, Scan Test Device with 18-Bit Bus Transceiver, Three-State Outputs, TTL Compatible Inputs, Monolithic Silicon


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FSC 5962 (Microcircuits, Electronic)

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Document Number

DESC-DWG-5962-94601

Revision Level

REVISION D

Status

Superseded

Publication Date

March 25, 2015

Page Count

24 pages