DD-IEC/PAS-62483 › Historical Revision Information
Test Method for Measuring Whisker Growth on Tin and Tin Alloy Surface Finishes

DD-IEC/PAS-62483 - REPLACED BY BS-IEC-62483 - SUPERSEDED -- See the following: BS-IEC-62483
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Test method for measuring whisker growth on tin and tin alloy surface finishes

Keywords

Tin;Tin alloys;Electronic equipment and components;Electroplating;Solders;Testing conditions;Corrosion;Metal coatings;Environmental testing;Surfaces;Finishes;Surface defects;Electrical components

To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

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Document Number

DD-IEC/PAS-62483

Revision Level

REPLACED BY BS-IEC-62483

Status

Superseded

Publication Date

Oct. 31, 2013

International Equivalent

IEC/PAS 62483:2006

Committee Number

EPL/47