DD-IEC-62215-2 › Integrated circuits. Measurement of impulse immunity. Synchronous transient injection method

DD-IEC-62215-2 - 2007 EDITION - CURRENT


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Integrated circuits. Measurement of impulse immunity. Synchronous transient injection method

Keywords

Integrated circuits, Semiconductors, Electronic equipment and components, Electromagnetic compatibility, Impulse voltages, Impulse-voltage tests, Transient voltages, Electrical measurement, Test equipment

To find similar documents by classification:

31.200 (Integrated circuits. Microelectronics Including electronic chips, logical and analogue microstructures Microprocessors, see 35.160)

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Document Number

DD IEC/TS 62215-2:2007

Revision Level

2007 EDITION

Status

Current

Publication Date

Nov. 30, 2007

Page Count

28

ISBN

9780580556913

International Equivalent

IEC/TS 62215-2:2007

Committee Number

EPL/47