DD-IEC-61967-3 › Integrated circuits. Measurement of electromagnetic emissions, 150 kHzto 1 GHz. Measurement of radiated emissions. Surface scan method

DD-IEC-61967-3 - 2005 EDITION - SUPERSEDED -- See the following: PD-IEC-61967-3
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Integrated circuits. Measurement of electromagnetic emissions, 150 kHzto 1 GHz. Measurement of radiated emissions. Surface scan method

Keywords

Integrated circuits, Electronic equipment and components, Emission, Electromagnetic radiation, Electromagnetic fields, Surfaces, Scanners, Radiofrequencies, Circuits, Radio disturbances, Noise (spurious signals), Electrical testing, Electrical measurement, Probes

To find similar documents by classification:

31.200 (Integrated circuits. Microelectronics Including electronic chips, logical and analogue microstructures Microprocessors, see 35.160)

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Document Number

DD IEC/TS 61967-3:2005

Revision Level

2005 EDITION

Status

Superseded

Publication Date

Jan. 9, 2006

Page Count

28

ISBN

0580464938

International Equivalent

IEC/TS 61967-3:2005

Committee Number

EPL/47