DD-ENV-50219 › Description of the reliability test structures of the European mini test chip

DD-ENV-50219 - 1996 EDITION - SUPERSEDED
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Description of the reliability test structures of the European mini test chip


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31.200 (Integrated circuits. Microelectronics Including electronic chips, logical and analogue microstructures Microprocessors, see 35.160)

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Document Number

DD ENV 50219:1996

Revision Level

1996 EDITION

Status

Superseded

Publication Date

Sept. 15, 1996

Page Count

42 pages