BS-ISO-25498 › Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
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Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
Keywords
Chemical analysis and testing;Electron diffraction;Spectroscopy;Test specimens;Microanalysis;Crystal lattices;Electron microscopes;Electron beams;Optical instruments
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Document Number
BS ISO 25498:2018
Revision Level
2018 EDITION
Status
Current
Publication Date
March 23, 2018
Replaces
BS ISO 25498:2010
Page Count
48
ISBN
9780580946929
International Equivalent
ISO 25498:2018
Committee Number
CII/9