BS-ISO-22489 › Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
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Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
Keywords
Test equipment;Spectroscopy;Wavelengths;X-ray analysis;Instrumental methods of analysis;X-rays;Specimen preparation;Microanalysis;Chemical analysis and testing;Dispersion (waves);Electron beams
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Document Number
BS ISO 22489:2016
Revision Level
2016 EDITION
Status
Current
Publication Date
Oct. 31, 2016
Replaces
BS ISO 22489:2006
Page Count
26
ISBN
9780580926709
International Equivalent
ISO 22489:2016
Committee Number
CII/9