BS-IEC-60747-14-1 › Semiconductor devices
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Semiconductor devices
Keywords
Inspection;Integrated circuits;Electronic equipment and components;Dielectric materials;Probes;Quality assurance;Testing conditions;Ferroelectric materials;Semiconductor devices;Specification (approval);Qualification approval;Semiconductors
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
BS IEC 60747-14-1:2010
Revision Level
2010 EDITION
Status
Current
Publication Date
April 30, 2010
Replaces
BS IEC 60747-14-1:2000
Page Count
26
ISBN
9780580629006
International Equivalent
IEC 60747-14-1:2010
Committee Number
EPL/47