BS-IEC-60747-14-1 Semiconductor devices

BS-IEC-60747-14-1 - 2010 EDITION - CURRENT
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Semiconductor devices

Keywords

Inspection;Integrated circuits;Electronic equipment and components;Dielectric materials;Probes;Quality assurance;Testing conditions;Ferroelectric materials;Semiconductor devices;Specification (approval);Qualification approval;Semiconductors

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31.080.01 (Semiconductor devices in general)

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Document Number

BS IEC 60747-14-1:2010

Revision Level

2010 EDITION

Status

Current

Publication Date

April 30, 2010

Replaces

BS IEC 60747-14-1:2000

Page Count

26

ISBN

9780580629006

International Equivalent

IEC 60747-14-1:2010

Committee Number

EPL/47