BS-IEC-60747-10 › Semiconductor devices

BS-IEC-60747-10 - 1991 EDITION - CURRENT


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Included in this current edition are the following subparts:

 1991 EDITION - Sept. 30, 1991
 AMD 9348 - July 1, 2011

Keywords

Semiconductor devices;Capability approval;Dimensions;Accelerated testing;Approval testing;Inspection;Testing conditions;Endurance testing;Documents;Integrated circuits;Sampling methods;Sampling tables;Quality assurance systems;Marking;Qualification approval;Orientation;Electronic equipment and components;Assessed quality;Specification (approval)

To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

31.200 (Integrated circuits. Microelectronics Including electronic chips, logical and analogue microstructures Microprocessors, see 35.160)

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Document Number

BS IEC 60747-10:1991

Revision Level

1991 EDITION

Status

Current

Publication Date

July 31, 2011

Replaces

BS 9970-0:1985;BS 9450:1998

Page Count

38

ISBN

9780580748202

International Equivalent

IEC 60747-10:1991;QC 700000:1991

Committee Number

EPL/47