BS-IEC-60747-1 › Semiconductor devices
BS-IEC-60747-1
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2006 EDITION
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CURRENT
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Included in this current edition are the following subparts:
2006 EDITION - June 30, 2006
AMD 16573 - Aug. 1, 2006
2006 EDITION CORRIGENDUM 2 - June 1, 2009
2006 EDITION AMENDMENT 1 - July 1, 2010
AMD 16573 - Aug. 1, 2006
2006 EDITION CORRIGENDUM 2 - June 1, 2009
2006 EDITION AMENDMENT 1 - July 1, 2010
Keywords
Colour codes;Endurance testing;Terminology;Electrical measurement;Letters (symbols);Measurement;Acceptance (approval);Reliability;Electrical testing;Semiconductor devices;Electric terminals;Testing conditions;Symbols;Graphic symbols;Marking;Sensitivity;Ratings;Electrostatics;Integrated circuits;Position;Identification methods;Storage;Labels;Electronic equipment and components
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
BS IEC 60747-1:2006+A1:2010
Revision Level
2006 EDITION
Status
Current
Publication Date
July 31, 2010
Replaces
BS 6493-1.1:1984
Page Count
46
ISBN
9780580682179
International Equivalent
IEC 60747-1:2006/AMD1:2010
Committee Number
EPL/47