BS-EN-IEC-60749-5 › Semiconductor devices. Mechanical and climatic test methods
BS-EN-IEC-60749-5
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2024 EDITION
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CURRENT
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Semiconductor devices. Mechanical and climatic test methods
Keywords
Humidity;Temperature;Mechanical testing;Test methods;Semiconductor devices
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
BS EN IEC 60749-5:2024
Revision Level
2024 EDITION
Status
Current
Publication Date
Feb. 6, 2024
Replaces
BS EN 60749-5:2017
Page Count
14
ISBN
9780539232165
International Equivalent
EN 60749-5 Ed.3.0;IEC 60749-5 Ed.3.0
Committee Number
EPL/47