BS-EN-IEC-60749-39 › Semiconductor devices. Mechanical and climatic test methods
BS-EN-IEC-60749-39
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2022 EDITION
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CURRENT
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Semiconductor devices. Mechanical and climatic test methods
Keywords
Solubility;Environmental testing;Diffusion;Moisture measurement;Water;Moisture control;Mechanical testing;Electronic equipment and components;Semiconductor devices
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
BS EN IEC 60749-39:2022
Revision Level
2022 EDITION
Status
Current
Publication Date
March 7, 2022
Replaces
BS EN 60749-39:2006
Page Count
18
ISBN
9780539152005
International Equivalent
EN 60749-39 Ed.2.0;IEC 60749-39 Ed.2.0
Committee Number
EPL/47