BS-EN-IEC-60749-37 › Semiconductor devices. Mechanical and climatic test methods
BS-EN-IEC-60749-37
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2022 EDITION
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CURRENT
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Semiconductor devices. Mechanical and climatic test methods
Keywords
Semiconductor devices;Semiconductors;Electronic components;Printed-circuit boards;Electrical failure;Failure analysis;Testing;Reports;Accelerometers
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
BS EN IEC 60749-37:2022
Revision Level
2022 EDITION
Status
Current
Publication Date
Nov. 22, 2022
Replaces
BS EN 60749-37:2008
Page Count
28
ISBN
9780539151992
International Equivalent
EN 60749-37 Ed.2.0;IEC 60749-37 Ed.2.0
Committee Number
EPL/47