BS-EN-IEC-60749-30 › Semiconductor devices. Mechanical and climatic test methods
BS-EN-IEC-60749-30
-
2020 EDITION
-
CURRENT
Document Center Inc. is an authorized dealer of BSI standards.
The following bibliographic material is provided to assist you with your purchasing decision:
The following bibliographic material is provided to assist you with your purchasing decision:
Semiconductor devices. Mechanical and climatic test methods
Keywords
Semiconductor devices;Electronic equipment and components;Mechanical testing;Performance testing;Specimen preparation;Environmental testing;Reliability;Climate;Surface mounting devices;Integrated circuits
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
This document comes with our free Notification Service, good for the life of the document.
This document is available in either Paper or PDF format.
Document Number
BS EN IEC 60749-30:2020
Revision Level
2020 EDITION
Status
Current
Publication Date
Sept. 30, 2020
Replaces
BS EN 60749-30:2005+A1:2011
Page Count
18
ISBN
9780539045833
International Equivalent
EN 60749-30 Ed.2.0;IEC 60749-30 Ed.2.0
Committee Number
EPL/47