BS-EN-IEC-60749-28 › Semiconductor devices. Mechanical and climatic test methods
BS-EN-IEC-60749-28
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2022 EDITION
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CURRENT
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Semiconductor devices. Mechanical and climatic test methods
Keywords
Electrostatics;Electric charge;Electronic equipment and components;Electric discharges;Mechanical testing;Semiconductor devices;Test methods;Environmental testing;Integrated circuits
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
BS EN IEC 60749-28:2022
Revision Level
2022 EDITION
Status
Current
Publication Date
Sept. 6, 2022
Replaces
BS EN 60749-28:2017
Page Count
54
ISBN
9780539136579
International Equivalent
EN 60749-28 Ed.2.0;IEC 60749-28 Ed.2.0
Committee Number
EPL/47