BS-EN-IEC-60749-17 › Semiconductor devices. Mechanical and climatic test methods
BS-EN-IEC-60749-17
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2019 EDITION
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CURRENT
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Semiconductor devices. Mechanical and climatic test methods
Keywords
Irradiation;Electronic equipment and components;Destructive testing;Climate;Neutrons;Military equipment;Integrated circuits;Military engineering;Dosimeters;Radiation measurement;Environmental testing;Mechanical testing;Nuclear particles;Space technology components;Degradation;Semiconductor devices
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
BS EN IEC 60749-17:2019
Revision Level
2019 EDITION
Status
Current
Publication Date
May 15, 2019
Replaces
BS EN 60749-17:2003
Page Count
14
ISBN
9780539000627
International Equivalent
IEC 60749-17 Ed.2.0;EN 60749-17 Ed.2.0
Committee Number
EPL/47