BS-EN-IEC-60749-15 › Semiconductor devices. Mechanical and climatic test methods
BS-EN-IEC-60749-15
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2020 EDITION
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CURRENT
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Semiconductor devices. Mechanical and climatic test methods
Keywords
Soldering;Environmental testing;Solderability testing;Slots;Destructive testing;Semiconductor devices;Encapsulated;Holes;Integrated circuits;Climate;Thermal testing;Electronic equipment and components;Mechanical testing
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
BS EN IEC 60749-15:2020
Revision Level
2020 EDITION
Status
Current
Publication Date
Oct. 1, 2020
Replaces
BS EN 60749-15:2010;BS EN 60749-15:2010
Page Count
16
ISBN
9780539049374
International Equivalent
EN 60749-15 Ed.3.0;IEC 60749-15 Ed.3.0
Committee Number
EPL/47