BS-EN-IEC-60749-12 › Semiconductor devices. Mechanical and climatic test methods
BS-EN-IEC-60749-12
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2018 EDITION
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CURRENT
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Semiconductor devices. Mechanical and climatic test methods
Keywords
Climate;Frequencies;Mechanical testing;Electronic equipment and components;Environmental testing;Vibration testing;Destructive testing;Integrated circuits;Semiconductor devices;Variable
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
BS EN IEC 60749-12:2018
Revision Level
2018 EDITION
Status
Current
Publication Date
April 18, 2018
Replaces
BS EN 60749-12:2002
Page Count
12
ISBN
9780580986826
International Equivalent
IEC 60749-12:2017;EN IEC 60749-12:2018
Committee Number
EPL/47