BS-EN-IEC-60749-10-TC › Tracked Changes. Semiconductor devices. Mechanical and climatic test methods
BS-EN-IEC-60749-10-TC
-
2022 EDITION
-
CURRENT
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Tracked Changes. Semiconductor devices. Mechanical and climatic test methods
Keywords
Impact testing;Mechanical testing;Semiconductor devices;Destructive testing;Climate;Integrated circuits;Mechanical shock;Electronic equipment and components;Environmental testing
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
BS EN IEC 60749-10:2022 - TC
Revision Level
2022 EDITION
Status
Current
Publication Date
Sept. 15, 2022
Page Count
38
ISBN
9780539234824
Committee Number
EPL/47