BS-EN-IEC-60749-10 › Semiconductor devices. Mechanical and climatic test methods
BS-EN-IEC-60749-10
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2022 EDITION
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CURRENT
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Semiconductor devices. Mechanical and climatic test methods
Keywords
Integrated circuits;Destructive testing;Electronic equipment and components;Mechanical shock;Environmental testing;Climate;Mechanical testing;Impact testing;Semiconductor devices
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
BS EN IEC 60749-10:2022
Revision Level
2022 EDITION
Status
Current
Publication Date
Aug. 16, 2022
Replaces
BS EN 60749-10:2002
Page Count
16
ISBN
9780539173451
International Equivalent
EN 60749-10 Ed.2.0;IEC 60749-10 Ed.2.0
Committee Number
EPL/47