BS-EN-60749-7 › Semiconductor devices. Mechanical and climatic test methods

BS-EN-60749-7 - 2011 EDITION - CURRENT
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Semiconductor devices. Mechanical and climatic test methods

Keywords

Water vapour;Mechanical testing;Climate;Moisture measurement;Integrated circuits;Semiconductor devices;Environmental testing;Water-vapour tests;Electronic equipment and components;Gas analysis

To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

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Document Number

BS EN 60749-7:2011

Revision Level

2011 EDITION

Status

Current

Publication Date

Sept. 30, 2011

Replaces

BS EN 60749-7:2002

Page Count

16

ISBN

9780580687525

International Equivalent

IEC 60749-7:2011;EN 60749-7:2011;IEC TS 62607-8-1:2020

Committee Number

EPL/47