BS-EN-60749-6 › Semiconductor devices. Mechanical and climatic test methods
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Semiconductor devices. Mechanical and climatic test methods
Keywords
High temperatures;Electronic storage;Semiconductor devices;Semiconductor storage;Climate;Integrated circuits;Environmental testing;Electronic equipment and components;Mechanical testing
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
BS EN 60749-6:2017
Revision Level
2017 EDITION
Status
Current
Publication Date
Nov. 24, 2017
Replaces
BS EN 60749-6:2002
Page Count
12
ISBN
9780580948923
International Equivalent
EN 60749-6:2017;IEC 60749-6:2017
Committee Number
EPL/47