BS-EN-60749-5 › Semiconductor devices. Mechanical and climatic test methods
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Semiconductor devices. Mechanical and climatic test methods
Keywords
Humidity;Temperature;Mechanical testing;Test methods;Semiconductor devices
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
BS EN 60749-5:2017
Revision Level
2017 EDITION
Status
Superseded
Publication Date
July 20, 2017
Replaces
BS EN 60749-5:2003
Replaced By
BS EN IEC 60749-5:2024
Page Count
16
ISBN
9780580958007
International Equivalent
IEC 60749-5:2017;EN 60749-5:2017;EN 60335-2-9:2003/A13:2010/AC:2011
Committee Number
EPL/47