BS-EN-60749-4 › Semiconductor devices. Mechanical and climatic test methods

BS-EN-60749-4 - 2017 EDITION - CURRENT
Show Complete Document History

Document Center Inc. is an authorized dealer of BSI standards.
The following bibliographic material is provided to assist you with your purchasing decision:

Semiconductor devices. Mechanical and climatic test methods

Keywords

Environmental testing;Semiconductor devices;Integrated circuits;Electronic equipment and components;Climate;Accelerated testing;Mechanical testing;Damp-heat tests

To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

This document comes with our free Notification Service, good for the life of the document.

This document is available in either Paper or PDF format.

ORDER

Price:

$143.00        


Want this as a site license?



Document Number

BS EN 60749-4:2017

Revision Level

2017 EDITION

Status

Current

Publication Date

Nov. 28, 2017

Replaces

BS EN 60749-4:2002

Page Count

16

ISBN

9780580942297

International Equivalent

EN 60749-4:2017;IEC 60749-4:2017

Committee Number

EPL/47