BS-EN-60749-39 › Semiconductor devices. Mechanical and climatic test methods

BS-EN-60749-39 - REPALCED BY BS-EN-IEC-60749-39 - CURRENT
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Semiconductor devices. Mechanical and climatic test methods

Keywords

Solubility;Environmental testing;Diffusion;Moisture measurement;Water;Moisture control;Mechanical testing;Electronic equipment and components;Semiconductor devices

To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

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Document Number

BS-EN-60749-39

Revision Level

REPALCED BY BS-EN-IEC-60749-39

Status

Current

Publication Date

March 7, 2022

International Equivalent

IEC 60749-39:2006;EN 60749-39:2006

Committee Number

EPL/47