BS-EN-60749-36 › Semiconductor devices. Mechanical and climatic test methods

BS-EN-60749-36 - 2003 EDITION - CURRENT


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Semiconductor devices. Mechanical and climatic test methods

Keywords

Endurance testing;Integrated circuits;Impact testing;Semiconductor devices;Mechanical testing;Electronic equipment and components;Acceleration measurement;Acceleration tests;Climate;Environmental testing;Stress;Destructive testing

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Document Number

BS EN 60749-36:2003

Revision Level

2003 EDITION

Status

Current

Publication Date

June 19, 2003

Replaces Notes

BS EN 60749:1999

Page Count

8

ISBN

0580420655

International Equivalent

IEC 60749-36:2003;EN 60749-36:2003

Committee Number

EPL/47