BS-EN-60749-32 › Semiconductor devices. Mechanical and climatic test methods

BS-EN-60749-32 - 2003/A1 EDITION - CURRENT
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Semiconductor devices. Mechanical and climatic test methods

Keywords

Climate;Semiconductor devices;Plastics;Flammability;Environmental testing;Electronic equipment and components;Mechanical testing;Encapsulated;Integrated circuits;Fire tests

To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

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Document Number

BS-EN-60749-32

Revision Level

2003/A1 EDITION

Status

Current

Publication Date

March 31, 2011

International Equivalent

EN 60749-32:2003/A1:2010;IEC 60749-32:2002/AMD1:2010

Committee Number

EPL/47