BS-EN-60749-31 › Semiconductor devices. Mechanical and climatic test methods

BS-EN-60749-31 - 2003 EDITION - CURRENT


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Semiconductor devices. Mechanical and climatic test methods

Keywords

Encapsulated;Semiconductor devices;Environmental testing;Electrical testing;Climate;Electronic equipment and components;Plastics;Flammability;Integrated circuits;Fire tests;Mechanical testing

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Document Number

BS EN 60749-31:2003

Revision Level

2003 EDITION

Status

Current

Publication Date

July 4, 2003

Replaces

BS EN 60749:1999

Page Count

8

ISBN

0580422003

International Equivalent

IEC 61073-1:2009;EN 60749-31:2003;IEC 60749-31:2002

Committee Number

EPL/47