BS-EN-60749-29 › Semiconductor devices. Mechanical and climatic test methods

BS-EN-60749-29 - 2011 EDITION - CURRENT
Show Complete Document History

Document Center Inc. is an authorized dealer of BSI standards.
The following bibliographic material is provided to assist you with your purchasing decision:

Semiconductor devices. Mechanical and climatic test methods

Keywords

Climate;Electrical testing;Overvoltage;Destructive testing;Failure rate;Environmental testing;Overvoltage tests;Mechanical testing;Electronic equipment and components;Integrated circuits;Semiconductor devices;Electrical faults;Electrical impedance

To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

This document comes with our free Notification Service, good for the life of the document.

This document is available in either Paper or PDF format.

ORDER

Price:

$236.60        


Want this as a site license?



Document Number

BS EN 60749-29:2011

Revision Level

2011 EDITION

Status

Current

Publication Date

Aug. 31, 2011

Replaces

BS EN 60749-29:2003;BS EN 60749-29:2003

Page Count

26

ISBN

9780580691386

International Equivalent

IEC 60749-29:2011;EN 60749-29:2011

Committee Number

EPL/47