BS-EN-60749-28 › Semiconductor devices. Mechanical and climatic test methods

BS-EN-60749-28 - 2017 EDITION - SUPERSEDED
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Semiconductor devices. Mechanical and climatic test methods

Keywords

Electrostatics;Electric charge;Electronic equipment and components;Electric discharges;Mechanical testing;Semiconductor devices;Test methods;Environmental testing;Integrated circuits

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31.080.01 (Semiconductor devices in general)

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Document Number

BS EN 60749-28:2017

Revision Level

2017 EDITION

Status

Superseded

Publication Date

July 10, 2017

Replaced By

BS EN IEC 60749-28:2022

Page Count

50

ISBN

9780580536786

International Equivalent

IEC 60749-28:2017;EN 60749-28:2017

Committee Number

EPL/47