BS-EN-60749-27 › Semiconductor devices. Mechanical and climatic test methods
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Semiconductor devices. Mechanical and climatic test methods
Keywords
Electrical testing;Grades (quality);Sensitivity;Damage;Semiconductor devices;Classification systems;Electronic equipment and components;Test models;Mechanical testing;Electrostatics;Integrated circuits;Degradation;Climate;Environmental testing
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
BS EN 60749-27:2006:2012
Revision Level
2006/A1 EDITION
Status
Current
Publication Date
Jan. 31, 2013
Replaces Notes
BS EN 60749:1999
Page Count
16
ISBN
9780580766084
International Equivalent
IEC 60749-27:2006/AMD1:2012;EN 60749-27:2006/A1:2012
Committee Number
EPL/47