BS-EN-60749-26 › Semiconductor devices. Mechanical and climatic test methods
BS-EN-60749-26
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2014 EDITION
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SUPERSEDED
-- See the following:
BS-EN-IEC-60749-26
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Semiconductor devices. Mechanical and climatic test methods
Keywords
Degradation;Integrated circuits;Human body;Climate;Grades (quality);Test models;Electrostatics;Electrical testing;Electronic equipment and components;Environmental testing;Sensitivity;Mechanical testing;Damage;Classification systems;Semiconductor devices
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
BS EN 60749-26:2014
Revision Level
2014 EDITION
Status
Superseded
Publication Date
June 30, 2014
Replaces
BS EN 60749-26:2006
Replaced By
BS EN IEC 60749-26:2018
Page Count
44
ISBN
9780580760990
International Equivalent
IEC 60749-26:2013;EN 60749-26:2014
Committee Number
EPL/47