BS-EN-60749-25 › Semiconductor devices. Mechanical and climatic test methods

BS-EN-60749-25 - 2003 EDITION - CURRENT


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Semiconductor devices. Mechanical and climatic test methods

Keywords

Thermal testing;Solders;Electronic equipment and components;Integrated circuits;Environmental testing;Climate;Testing conditions;Thermal-cycling tests;Semiconductor devices;Heating tests;Mechanical testing

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Document Number

BS EN 60749-25:2003

Revision Level

2003 EDITION

Status

Current

Publication Date

Oct. 30, 2003

Replaces Notes

BS EN 60749:1999

Page Count

16

ISBN

0580428591

International Equivalent

IEC 60749-25:2003;EN 60749-25:2003;EN 60068-2-30:1999

Committee Number

EPL/47