BS-EN-60749-24 › Semiconductor devices. Mechanical and climatic test methods
BS-EN-60749-24
-
2004 EDITION
-
CURRENT
Document Center Inc. is an authorized dealer of BSI standards.
The following bibliographic material is provided to assist you with your purchasing decision:
The following bibliographic material is provided to assist you with your purchasing decision:
Semiconductor devices. Mechanical and climatic test methods
Keywords
Solid-state physics;Accelerated testing;Mechanical testing;Semiconductor devices;Accelerated corrosion tests;Moisture measurement;Climate;Temperature;Humidity;Performance testing;Corrosion resistance;Destructive testing;Electronic equipment and components;Damp-heat tests;Reliability;Environmental testing;Integrated circuits;Testing conditions
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
This document comes with our free Notification Service, good for the life of the document.
This document is available in either Paper or PDF format.
Document Number
BS EN 60749-24:2004
Revision Level
2004 EDITION
Status
Current
Publication Date
June 24, 2004
Page Count
10
ISBN
0580439720
International Equivalent
IEC 60749-24:2004;EN 60749-24:2004
Committee Number
EPL/47