BS-EN-60749-23 › Semiconductor devices. Mechanical and climatic test methods
BS-EN-60749-23
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2004 EDITION
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CURRENT
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Included in this current edition are the following subparts:
2004 EDITION - June 24, 2004
2004 EDITION AMENDMENT 1 - June 1, 2011
2004 EDITION AMENDMENT 1 - June 1, 2011
Keywords
Integrated circuits;Thermal testing;High-temperature testing;Reliability;Performance testing;Life (durability);Climate;Mechanical testing;Qualification approval;Endurance testing;Semiconductor devices;Environmental testing;Electronic equipment and components;Accelerated testing;Operating conditions
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
BS EN 60749-23:2004+A1:2011
Revision Level
2004 EDITION
Status
Current
Publication Date
June 30, 2011
Page Count
12
ISBN
9780580687532
International Equivalent
IEC 61051-1:2018;IEC 60749-23:2004/AMD1:2011;EN 60749-23:2004/A1:2011
Committee Number
EPL/47